Wafer Measurement System

Model name : MFM-3500

Feature

The operation process is simple, reducing training costs. Manual placement of the test object, with the machine automatically positioning, measuring, and outputting reports.
The porous ceramic chuck fully adheres to the test object.
The granite base paired with an air-floating vibration isolation table effectively isolates high-frequency vibrations, minimizing the impact of machine vibrations.
High-precision moving motors. Dustproof cover designed for cleanroom environments.
Connection management SECS/GEM (optional).