Semi-Auto Measurement System
(AT-S300 Series)
Advantage
- Auto-Load recipe by Barcode.
- Auto Re-measurement function.
- Adjustable for Spectrum wavelength.
- Re-update statistic data function.
- Re-execute single or multi-location measurement task.
- Easer-tuning for measurement recipe.
- Anti-Interfere for High-Bump wafer thickness measurement.
- Multi-Spectrometer configuration for option.
- FAST 3D wafer map & 2D curve data drawing function.
- Smart search function for Target layer signal.
System SPEC
Item | SPEC | AT-S300T | AT-S300R | AT-S300TR |
Wavelength | 1470~1530nm (Adjustable) | V | V | |
Sensor working distance | 5~8mm | V | V | |
Wafer type | 2″~12″(unframed and framed) | V | V | V |
Thickness Measuring accuracy | less than +/-0.5um (Silicon) | V | V | |
Thickness Measuring range | 7um~800um Base on Silicon | V | V | |
Film Measuring range | 10um~120um (DAF) | V | V | |
Thickness Measuring repeatability | less than +/-0.5um | V | V | |
Roughness Measuring range | Ra 1nm~100nm | V | V | |
Roughness Measuring repeatability & Accuracy | Ra less than 20nm(+/-0.5nm); Ra more than 20nm(5%) | V | V | |
Option | SECS/GEM EXTENSION | V | V | V |
Option | THIN-FILM Measurement module | V | V | V |
Option | ESD IONIZER | V | V | V |
◎The Accuracy depend on the used wavelengths.
Compare with German Brand
Model name | AT-S300系列 | 德系301系列 |
Measurement Accuracy | +/-0.5um | +/-0.5um |
Measurement Repeatability | +/-0.5um | +/-0.5um |
Without Z-axis focusing damage risk | Yes | X |
Incoming wafer Warpage limitation for Thickness measurement | less than 5mm | less than 1.2mm |
Wafer warpage measure limitation | Max. 5000um | Max. 1200um |
High-warpage wafer THK measurement | Yes | X |
High-warp wafer Warpage measurement | Yes | X |
Auto search main measure target | Yes | X |
Auto search good signal area (Re-try) | Yes | X |
Adjustble wavelength | Yes | X |
Re-Update measured data function | Yes | X |
Fast – 3D wafer map | Yes | X |
Thick-DAF layer thickness application | Yes | X |
Thin-DAF layer thickness application | Yes | X |